Sem/edx laboratories in the USA near me? Close examination of any possible defects or voids was undertaken at higher magnification. The voids did not appear to create any structural or conductivity issues. Additionally, the formation and contiguity of intermetallic bonds between the contacts and solder were shown using a combination of EDS line scan elemental spectroscopy and elemental mapping. The SEM image and the EDS map to the left show the intermetallic layer between the copper wire and the tin/lead solder via the mixture of the red copper and the blue tin.
The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
Examining the sample with a polarized light microscope (PLM), it was darker and coarser than expected for a mold sample. The dust appeared to be a closed cell, synthetic blown foam material, and all from the same source. The black color was likely due to pigment particles added to color the foam. Fourier Transform Infra-Red spectroscopy was performed on the foam particles. The spectrum showed a mixture of spectral features, associated with vinyl acetates, polyurethane, and cellulose or other sugar-like polymers. Based on these features, a common urethane acetate foam was determined as the likely source material.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile. See more details at Microvision laboratories.
How do I submit a sample or a set of samples? To submit a sample or set of samples, please see the page How to Submit Samples. What if I believe my samples are hazardous? We are not equipped to handle or dispose of every kind of hazardous material. Please call us before sending in any potentially hazardous samples. In cases where we are able to analyze your harzardous samples we may not be able to dispose of them and therefore we will return them to you.
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why. X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects. See extra details on https://microvisionlabs.com/.